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Part Number TPC8210

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TPC8210
2003-02-18
1
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (U-MOS III)
TPC8210
Lithium Ion Battery Applications
Portable Equipment Applications
Notebook PC Applications


l Low drain-source ON resistance: R
DS
(ON)
= 11 m (typ.)
l High forward transfer admittance: |Y
fs
| = 13 S (typ.)
l Low leakage current: I
DSS
= 10 µA (max) (V
DS
= 30 V)
l Enhancement-mode: V
th
= 1.3 to 2.5 V (V
DS
= 10 V, I
D
= 1 mA)
Maximum Ratings
(Ta = 25°C)
Characteristics Symbol
Rating
Unit
Drain-source voltage
V
DSS
30 V
Drain-gate voltage (R
GS
= 20 k) V
DGR
30 V
Gate-source voltage
V
GSS
±20 V
D C
(Note 1)
I
D
8
Drain current
Pulse (Note
1) I
DP
32
A
Single-device
operation
(Note
3a)
P
D (1)
1.5
Drain power
dissipation
(t = 10 s)
(Note 2a)
Single-device value
at dual operation
(Note 3b)
P
D(2)
1.1
W
Single-device
operation
(Note
3a)
P
D (1)
0.75
Drain power
dissipation
(t = 10 s)
(Note 2b)
Single-device value
at dual operation
(Note 3b)
P
D (2)
0.45
W
Single pulse avalanche energy
(Note
4)
E
AS
83.2 mJ
Avalanche current
I
AR
8 A
Repetitive avalanche energy
Single-device value at dual operation
(Note 2a, 3b, 5)
E
AR
0.1 mJ
Channel temperature
T
ch
150
°C
Storage temperature range
T
stg
-55 to 150
°C
Note: For (Note 1), (Note 2), (Note 3), (Note 4) and (Note 5), please
refer to the next page.
This transistor is an electrostatic sensitive device. Please handle with caution.
Unit: mm
JEDEC
JEITA
TOSHIBA 2-6J1E
Weight: 0.08 g (typ.)
Circuit Configuration
8 7 6 5
1 2 3 4
TPC8210
2003-02-18
2
Thermal Characteristics
Characteristics Symbol
Max
Unit
Single-device operation
(Note 3a)
R
th (ch-a) (1)
83.3
Thermal resistance, channel to ambient
(t = 10 s)
(Note 2a) Single-device value at
dual operation
(Note 3b)
R
th (ch-a) (2)
114
Single-device operation
(Note 3a)
R
th (ch-a) (1)
167
Thermal resistance, channel to ambient
(t = 10 s)
(Note 2b) Single-device value at
dual operation
(Note 3b)
R
th (ch-a) (2)
278
°C/W
Marking (Note 6)
Note 1: Please use devices on condition that the channel temperature is below 150°C.
Note 2:
a) Device mounted on a glass-epoxy board (a)
b)
Device mounted on a glass-epoxy board (b)

Note 3:
a) The power dissipation and thermal resistance values are shown for a single device.
(During single-device operation, power is only applied to one device.)
b) The power dissipation and thermal resistance values are shown for a single device.
(During dual operation, power is evenly applied to both devices.)
Note 4: V
DD
= 24 V, T
ch
= 25°C (initial), L = 1.0 mH, R
G
= 25 , I
AR
= 8 A
Note 5: Repetitive rating: pulse width limited by maximum channel temperature
Note 6:
· on lower left of the marking indicates Pin 1.
FR-4
25.4
´ 25.4 ´ 0.8
(unit: mm)
(a)
FR-4
25.4
´ 25.4 ´ 0.8
(unit: mm)
(b)
Type
TPC8210
Lot No.
Weekly code:
(Three digits)
Week of manufacture
(01 for first week of year, continues up to 52 or 53)
Year of manufacture
(One low-order digits of calendar year)
TPC8210
2003-02-18
3
Electrical Characteristics
(Ta = 25°C)
Characteristics Symbol
Test
Condition
Min
Typ.
Max
Unit
Gate leakage current
I
GSS
V
GS
= ±16 V
, V
DS
= 0 V
--
±10
µA
Drain cut-OFF current
I
DSS
V
DS
= 30 V
, V
GS
= 0 V
10 µA
V
(BR) DSS
I
D
= 10 mA
, V
GS
= 0 V
30
Drain-source breakdown voltage
V
(BR) DSS
I
D
= 10 mA
, V
GS
=
-20 V
15
¾
¾
V
Gate threshold voltage
V
th
V
DS
= 10 V,
I
D
= 1 mA
1.3
2.5 V
R
DS (ON)
V
GS
= 4.5 V,
I
D
= 4 A
¾ 13 20
Drain-source ON resistance
R
DS (ON)
V
GS
= 10 V,
I
D
= 4 A
11 15
m
Forward transfer admittance
|Y
fs
| V
DS
= 10 V,
I
D
= 4 A
6.5 13 S
Input capacitance
C
iss
3530
Reverse transfer capacitance
C
rss
495
Output capacitance
C
oss
V
DS
= 10 V, V
GS
= 0 V, f = 1 MHz
580
pF
Rise time
tr
26
Turn-ON time
t
on
39
Fall time
t
f
32
Switching time
Turn-OFF time
t
off

Duty <= 1%, t
w
= 10 ms
115
ns
Total gate charge (Gate-source
plus gate-drain)
Q
g
75
Gate-source charge
Q
gs
6
Gate-drain ("miller") charge
Q
gd
V
DD
24 V, V
GS
= 10 V, I
D
= 8 A
19
nC
Source-Drain Ratings and Characteristics
(Ta =
25°C)
Characteristics Symbol
Test
Condition
Min
Typ.
Max
Unit
Drain reverse
current
Pulse (Note 1)
I
DRP
-- --
--
32
A
Forward voltage (diode)
V
DSF
I
DR
= 8 A, V
GS
= 0 V
-- -- -1.2
V


R
L

=
3.
7

W
V
DD
~
- 15 V
0 V
V
GS
10 V
4.
7
W
I
D
= 4 A
V
OUT
TPC8210
2003-02-18
4



























0
20
0
0.5
1 1.5
4
4
8
12
16
Common source
VDS = 10 V
Pulse test
2
3
25
100
Ta
= -55°C
2.5 2.5
I
D
­ V
DS
Drain-source voltage V
DS
(V)
D
r
ai
n
cu
rre
nt

I
D
(A
)
I
D
­ V
DS
Drain-source voltage V
DS
(V)
D
r
ai
n
cu
rre
nt

I
D
(A
)
I
D
­ V
GS
Gate-source voltage V
GS
(V)
D
r
ai
n
cu
rre
nt

I
D
(A
)
V
DS
­ V
GS
D
r
ai
n
-
so
urc
e
v
o
l
t
a
ge

V
DS
(V
)
Gate-source voltage V
GS
(V)
|Y
fs
| ­ I
D
Fo
rw
ar
d t
r
a
n
sfe
r

ad
mi
ttanc
e

ï
Y
fs
ï
(
S
)
Drain current I
D
(A)
0.1 1 10 100
0.1
1
10
100
Common source
VDS = 10 V
Pulse test
Tc
= 100°C
-55°C
25°C
R
DS (ON)
­ I
D
Drain current I
D
(A)
D
r
ai
n
-
so
urc
e
O
N
r
e
si
stanc
e
R
DS (ON)
(m
W
)
1
3
30 100
Common source
Ta
= 25°C
Pulse test
1
10
100
VGS = 10 V
VGE = 4.5 V
3
30
10
0.4
0.6 0.8 1.0
0
4
6
8
10
2
0
0.2
VGS = 2.2 V
2.3
2.4
2.5
2.6
2.7
2.8
3
2.9
6
8
10
Common source
Ta
= 25°C
Pulse test
4
6
8
10
0 1 2 3 4 5
0
4
8
12
16
20
VGS = 2.3 V
2.7
2.9
2.8
2.4
2.6
2.5
3
Common source
Ta
= 25°C
Pulse test
0
4
8
20
0
0.6
1
0.8
0.2
0.4
ID = 2A
8
Common source
Ta
= 25°C
Pulse test
12 16
4
TPC8210
2003-02-18
5












R
DS (ON)
­ Ta
Ambient temperature Ta (°C)
D
r
ai
n
-
so
urc
e
O
N
r
e
si
stanc
e

R
DS
(
O
N)
(
W
)
I
DR
­ V
DS
Drain-source voltage V
DS
(V)
D
r
ai
n
re
ver
s
e c
u
r
r
e
n
t

I
DR
(
A
)
Capacitance ­ V
DS
Drain-source voltage V
DS
(V)
C
apaci
t
anc
e C
(p
F)
0.1 1 10 100
10
100
1000
10000
Crss
Coss
Ciss
Common source
VGS = 10 V
ID = 1 mA
Pulse test
V
th
­ Ta
Ambient temperature Ta (°C)
Gate
th
res
hol
d vol
t
a
ge

V
th
(
V
)
P
D
­ Ta
D
r
ai
n
po
w
e
r
di
ssi
p
a
ti
on


P
D
(W
)
Ambient temperature Ta (°C)
0
0
0.5
1.0
1.5
2
50 100
150 200
(1) Device mounted on a
glass-epoxy board (a)
(Note 2a)
(2) Device mounted on a
glass-epoxy board (b)
(Note 2b)
t
= 10 s
(1)
(2)
(3)
(4)
Dynamic input/output characteristics
D
r
ai
n
-
so
urc
e
v
o
l
t
a
ge

V
DS
(V
)
Gate
-so
u
r
c
e
v
o
l
t
age
V
GS
(V
)
Total gate charge Q
g
(nC)
-80
-40 0 40
80
160
120
0
5
10
25
15
20
Common source
Pulse test
VGS = 4.5 V
ID = 8, 4, 2 A
10 V
ID = 8, 4, 2 A
-80
-40
0
40
80 120 140
Common source
V
DS
= 10 V
f
= 1 mA
Pulse test
0
1
3
2
0.5
1.5
2.5
1
10
0
-0.4
-0.6
-0.8
-1.2
-0.2
100
-1
3
1
5
VGS = 0 V
Common source
Ta
= 25°C
Pulse test
0
20
40
60 80 100
0
15
10
20
30
5
25
0
15
10
20
30
5
25
Common source
Ta
= 25°C
I
D
= 8 A
Pulse test
12
VDS
VDD = 24 V
12
6
VDD = 24 V
6
TPC8210
2003-02-18
6

























































Drain-source voltage V
DS
(V)
D
r
ai
n
cu
rre
nt

I
D
(A
)
Safe operating area
0.01
0.01 0.1 1
10 100
0.1
1
10
100
* Single pulse
Ta
= 25°C
Curves must be derated
linearly with increase in
temperature.
ID max (pluse) *
10 ms*
1 ms*
VDSS max
Pulse width t
w
(S)
r
th
- t
w
Norm
al
i
z
ed t
r
ans
i
e
n
t
t
herm
a
l
i
m
pe
danc
e
r
th
(
°
C
/
W
)
0.1
0.001 0.01 0.1
1
10 100 1000
1
10
100
1000
Device mounted on a glass-epoxy board (a) (Note 2a)
(1) Single-device operation (Note 3a)
(2) Single-device value at dual operation (Note 3b)
Device mounted on a glass-epoxy board (b) (Note 2b)
(3) Single-device operation (Note 3a)
(4) Single-device value at dual operation (Note 3b)
t
= 10 s
(4)
(3)
(2)
(1)
Single pulse
TPC8210
2003-02-18
7
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devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
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000707EAA
RESTRICTIONS ON PRODUCT USE