CD54ACT112, CD74ACT112
DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS
WITH CLEAR AND PRESET
SCHS323 JANUARY 2003
1
POST OFFICE BOX 655303
·
DALLAS, TEXAS 75265
D
Inputs Are TTL-Voltage Compatible
D
Speed of Bipolar F, AS, and S, With
Significantly Reduced Power Consumption
D
Balanced Propagation Delays
D
±
24-mA Output Drive Current
Fanout to 15 F Devices
D
SCR-Latchup-Resistant CMOS Process and
Circuit Design
D
Exceeds 2-kV ESD Protection Per
MIL-STD-883, Method 3015
description/ordering information
The 'ACT112 devices contain two independent J-K negative-edge-triggered flip-flops. A low level at the preset
(PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the other inputs. When PRE
and CLR are inactive (high), data at the J and K inputs meeting the setup-time requirements is transferred to
the outputs on the negative-going edge of the clock pulse (CLK). Clock triggering occurs at a voltage level and
is not directly related to the fall time of the clock pulse. Following the hold-time interval, data at the J and K inputs
may be changed without affecting the levels at the outputs. These versatile flip-flops can perform as toggle
flip-flops by tying J and K high.
ORDERING INFORMATION
TA
PACKAGE
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
SOIC
M
Tube
CD74ACT112M
ACT112M
55
°
C to 125
°
C
SOIC M
Tape and reel
CD74ACT112M96
ACT112M
CDIP F
Tube
CD54ACT112F3A
CD54ACT112F3A
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
FUNCTION TABLE
(each flip-flop)
INPUTS
OUTPUTS
PRE
CLR
CLK
J
K
Q
Q
L
H
X
X
X
H
L
H
L
X
X
X
L
H
L
L
X
X
X
H
H
H
H
L
L
Q0
Q0
H
H
H
L
H
L
H
H
L
H
L
H
H
H
H
H
Toggle
H
H
H
X
X
Q0
Q0
Output states are unpredictable if PRE and CLR go high
simultaneously after both being low at the same time.
CD54ACT112 . . . F PACKAGE
CD74ACT112 . . . M PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
8
16
15
14
13
12
11
10
9
1CLK
1K
1J
1PRE
1Q
1Q
2Q
GND
V
CC
1CLR
2CLR
2CLK
2K
2J
2PRE
2Q
Copyright
2003, Texas Instruments Incorporated
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
CD54ACT112, CD74ACT112
DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS
WITH CLEAR AND PRESET
SCHS323 JANUARY 2003
2
POST OFFICE BOX 655303
·
DALLAS, TEXAS 75265
logic diagram (positive logic)
PRE
CLK
K
Q
Q
CLR
J
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
0.5 V to 6 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, I
IK
(V
I
< 0 V or V
I
> V
CC
)
(see Note 1)
±
20 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, I
OK
(V
O
< 0 V or V
O
> V
CC
)
(see Note 1)
±
50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous output current, I
O
(V
O
> 0 V or V
O
< V
CC
)
±
50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous current through V
CC
or GND
±
100 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Package thermal impedance,
JA
(see Note 2)
73
°
C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
65
°
C to 150
°
C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES:
1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51-7.
recommended operating conditions (see Note 3)
TA = 25
°
C
55
°
C to
125
°
C
40
°
C to
85
°
C
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
VCC
Supply voltage
4.5
5.5
4.5
5.5
4.5
5.5
V
VIH
High-level input voltage
2
2
2
V
VIL
Low-level input voltage
0.8
0.8
0.8
V
VI
Input voltage
0
VCC
0
VCC
0
VCC
V
VO
Output voltage
0
VCC
0
VCC
0
VCC
V
IOH
High-level output current
24
24
24
mA
IOL
Low-level output current
24
24
24
mA
t/
v
Input transition rise or fall rate
10
10
10
ns/V
NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
CD54ACT112, CD74ACT112
DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS
WITH CLEAR AND PRESET
SCHS323 JANUARY 2003
3
POST OFFICE BOX 655303
·
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
TA = 25
°
C
55
°
C to
125
°
C
40
°
C to
85
°
C
UNIT
CC
MIN
MAX
MIN
MAX
MIN
MAX
IOH = 50
µ
A
4.5 V
4.4
4.4
4.4
VOH
VI = VIH or VIL
IOH = 24 mA
4.5 V
3.94
3.7
3.8
V
VOH
VI = VIH or VIL
IOH = 50 mA
5.5 V
3.85
V
IOH = 75 mA
5.5 V
3.85
IOL = 50
µ
A
4.5 V
0.1
0.1
0.1
VOL
VI = VIH or VIL
IOL = 24 mA
4.5 V
0.36
0.5
0.44
V
VOL
VI = VIH or VIL
IOL = 50 mA
5.5 V
1.65
V
IOL = 75 mA
5.5 V
1.65
II
VI = VCC or GND
5.5 V
±
0.1
±
1
±
1
µ
A
ICC
VI = VCC or GND,
IO = 0
5.5 V
4
80
40
µ
A
D
ICC
VI = VCC 2.1 V
4.5 V to
5.5 V
2.4
3
2.8
mA
Ci
10
10
10
pF
Test one output at a time, not exceeding 1-second duration. Measurement is made by forcing indicated current and measuring voltage to minimize
power dissipation. Test verifies a minimum 50-
transmission-line drive capability at 85
°
C and 75-
transmission-line drive capability at 125
°
C.
ACT INPUT LOAD TABLE
INPUT
UNIT LOAD
J or CLK
1
K
0.53
CLR or PRE
0.58
Unit Load is
ICC limit specified in
electrical characteristics table
(e.g., 2.4 mA at 25
°
C).
timing requirements over recommended operating conditions (unless otherwise noted)
55
°
C to
125
°
C
40
°
C to
85
°
C
UNIT
MIN
MAX
MIN
MAX
fclock
Clock frequency
100
114
MHz
t
Pulse duration
CLK high or low
5
4.4
ns
tw
Pulse duration
CLR or PRE low
5.5
4.8
ns
tsu
Setup time, before CLK
J or K
4
3.5
ns
th
Hold time, after CLK
J or K
1
1
ns
trec
Recovery time, before CLK
CLR
or PRE
2.5
2.2
ns
CD54ACT112, CD74ACT112
DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS
WITH CLEAR AND PRESET
SCHS323 JANUARY 2003
4
POST OFFICE BOX 655303
·
DALLAS, TEXAS 75265
switching characteristics over recommended operating free-air temperature range,
V
CC
= 5 V
±
0.5 V, C
L
= 50 pF (unless otherwise noted) (see Figure 1)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
55
°
C to
125
°
C
40
°
C to
85
°
C
UNIT
(INPUT)
(OUTPUT)
MIN
MAX
MIN
MAX
fmax
100
114
MHz
tPLH
CLK
Q
Q
2.6
10.3
2.7
9.4
ns
tPLH
CLR or PRE
Q or Q
3.1
12.2
3.2
11.1
ns
tPHL
CLK
Q or Q
2.6
10.3
2.7
9.4
ns
tPHL
CLR or PRE
Q or Q
3.1
12.2
3.2
11.1
ns
operating characteristics, V
CC
= 5 V, T
A
= 25
°
C
PARAMETER
TYP
UNIT
Cpd
Power dissipation capacitance
56
pF
CD54ACT112, CD74ACT112
DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOPS
WITH CLEAR AND PRESET
SCHS323 JANUARY 2003
5
POST OFFICE BOX 655303
·
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
VOLTAGE WAVEFORMS
SETUP AND HOLD AND INPUT RISE AND FALL TIMES
th
tsu
10%
10%
90%
90%
3 V
3 V
0 V
0 V
tr
tf
Reference
Input
Data
Input
VOLTAGE WAVEFORMS
PROPAGATION DELAY AND OUTPUT TRANSITION TIMES
50% VCC
50%
10%
10%
90%
90%
3 V
VOH
VOL
0 V
tr
tf
Input
In-Phase
Output
tPLH
tPHL
50% VCC
50%
10%
10%
90%
90%
VOH
VOL
tr
tf
tPHL
tPLH
Out-of-Phase
Output
NOTES: A. CL includes probe and test-fixture capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR
1 MHz, ZO = 50
, tr = 3 ns, tf = 3 ns.
Phase relationships between waveforms are arbitrary.
D. For clock inputs, fmax is measured with the input duty cycle at 50%.
E. The outputs are measured one at a time with one input transition per measurement.
F. tPLH and tPHL are the same as tpd.
G. tPZL and tPZH are the same as ten.
H. tPLZ and tPHZ are the same as tdis.
I. All parameters and waveforms are not applicable to all devices.
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT
S1
2
×
VCC
R1 = 500
Open
GND
0 V
tw
VOLTAGE WAVEFORMS
PULSE DURATION
Input
3 V
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
Open
2
×
VCC
GND
TEST
S1
Output
Control
Output
Waveform 1
S1 at 2
×
VCC
(see Note B)
Output
Waveform 2
S1 at GND
(see Note B)
VOL
VOH
tPZL
tPZH
tPLZ
tPHZ
VCC
0 V
20% VCC
20% VCC
80% VCC
0 V
VOLTAGE WAVEFORMS
OUTPUT ENABLE AND DISABLE TIMES
80% VCC
3 V
R2 = 500
VOLTAGE WAVEFORMS
RECOVERY TIME
3 V
0 V
CLR
Input
CLK
3 V
trec
0 V
1.5 V
1.5 V
1.5 V
1.5 V
1.5 V
1.5 V
1.5 V
1.5 V
1.5 V
1.5 V
1.5 V
Figure 1. Load Circuit and Voltage Waveforms
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