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Part Number IRFN240

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Product Summary
Part Number
BV
DSS
R
DS(on)
I
D
IRFN240
200V
0.18
18A
Features:
s
Avalanche Energy Rating
s
Dynamic dv/dt Rating
s
Simple Drive Requirements
s
Ease of Paralleling
s
Hermetically Sealed
s
Surface Mount
s
Light-weight
N-CHANNEL
Provisional Data Sheet No. PD-9.1548
200 Volt, 0.18
HEXFET
HEXFET technology is the key to International Rectifier's
advanced line of power MOSFET transistors. The effi-
cient geometry achieves very low on-state resistance com-
bined with high transconductance.
HEXFET transistors also feature all of the well-establish
advantages of MOSFETs, such as voltage control, very
fast switching, ease of paralleling and electrical param-
eter temperature stability. They are well-suited for appli-
cations such as switching power supplies, motor controls,
inverters, choppers, audio amplifiers, and high energy
pulse circuits.
The Surface Mount Device (SMD-1) package represents
another step in the continual evolution of surface mount
technology. The SMD-1 will give designers the extra flex-
ibility they need to increase circuit board density. Inter-
national Rectifier has engineered the SMD-1 package to
meet the specific needs of the power market by increas-
ing the size of the termination pads, thereby enhancing
thermal and electrical performance.
IRFN240
HEXFET
®
POWER MOSFET
Absolute Maximum Ratings
Parameter
IRFN240
Units
ID @ VGS = 10V, TC = 25°C
Continuous Drain Current
18
ID @ VGS = 10V, TC = 100°C Continuous Drain Current
11
IDM
Pulsed Drain Current
72
PD @ TC = 25°C
Max. Power Dissipation
125
W
Linear Derating Factor
1.0
W/K
VGS
Gate-to-Source Voltage
±20
V
EAS
Single Pulse Avalanche Energy
450
mJ
IAR
Avalanche Current
18
A
EAR
Repetitive Avalanche Energy
12.5
mJ
dv/dt
Peak Diode Recovery dv/dt
5.0
V/ns
TJ
Operating Junction
-55 to 150
TSTG
Storage Temperature Range
Package Mounting Surface Temperature
300 (for 5 seconds)
Weight
2.6 (typical)
g
o
C
A
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Thermal Resistance
Parameter
Min. Typ. Max. Units
Test Conditions
RthJC
Junction-to-Case
--
--
1.0
RthJ-PCB
Junction-to-PC Board
--
TBD
--
K/W
Soldered to a copper clad PC board
Source-Drain Diode Ratings and Characteristics
Parameter
Min. Typ. Max. Units
Test Conditions
IS
Continuous Source Current (Body Diode)
--
--
18
Modified MOSFET symbol showing the
ISM
Pulse Source Current (Body Diode)
--
--
72
integral reverse p-n junction rectifier.
VSD
Diode Forward Voltage
--
--
1.5
V
T
j
= 25°C, IS = 18A, VGS = 0V
trr
Reverse Recovery Time
--
--
500
ns
Tj = 25°C, IF = 18A, di/dt
100A/
µ
s
QRR
Reverse Recovery Charge
--
--
5.3
µ
C
VDD
50V
ton
Forward Turn-On Time
Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD.
Electrical Characteristics
@ Tj = 25°C (Unless Otherwise Specified)
Parameter
Min.
Typ. Max. Units
Test Conditions
BVDSS
Drain-to-Source Breakdown Voltage
200
--
--
V
VGS = 0V, ID = 1.0 mA
BVDSS/
TJ Temperature Coefficient of Breakdown
--
0.29
--
V/°C
Reference to 25°C, ID = 1.0 mA
Voltage
RDS(on)
Static Drain-to-Source
--
--
0.18
VGS = 10V, ID = 11A
On-State Resistance
--
--
0.25
VGS = 10V, ID = 18A
VGS(th)
Gate Threshold Voltage
2.0
--
4.0
V
VDS = VGS, ID = 250
µ
A
gfs
Forward Transconductance
6.1
--
--
S (
)
VDS > 15V, IDS = 11A
IDSS
Zero Gate Voltage Drain Current
--
--
25
VDS = 0.8 x Max Rating,VGS = 0V
--
--
250
VDS = 0.8 x Max Rating
VGS = 0V, TJ = 125°C
IGSS
Gate-to-Source Leakage Forward
--
--
100
VGS = 20V
IGSS
Gate-to-Source Leakage Reverse
--
--
-100
VGS = -20V
Qg
Total Gate Charge
32
--
60
VGS =10V, ID = 18A
Qgs
Gate-to-Source Charge
2.2
--
10.6
VDS = Max. Rating x 0.5
Qgd
Gate-to-Drain ("Miller") Charge
14.2
--
37.6
see figures 6 and 13
td(on)
Turn-On Delay Time
--
--
20
VDD = 100V, ID = 18A,
tr
Rise Time
--
--
152
RG = 9.1
,
VGS = 10V
td(off)
Turn-Off Delay Time
--
--
58
tf
Fall Time
--
--
67
see figure 10
LD
Internal Drain Inductance
--
2.0
--
LS
Internal Source Inductance
--
6.5
--
Ciss
Input Capacitance
--
1300
--
VGS = 0V, VDS = 25V
Coss
Output Capacitance
--
400
--
f = 1.0 MHz
Crss
Reverse Transfer Capacitance
--
130
--
see figure 5
IRFN240 Device
µ
A
nC
pF
nH
ns
Measured from the
drain lead, 6mm (0.25
in.) from package to
center of die.
Measured from the
source lead, 6mm
(0.25 in.) from package
to source bonding pad.
Modified MOSFET
symbol showing the
internal inductances.
nA
A
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IRFN240 Device
Fig. 1 -- Typical Output Characteristics
T
C
= 25°C
Fig. 2 -- Typical Output Characteristics
T
C
= 150°C
Fig. 3 -- Typical Transfer Characteristics
Fig. 4 -- Normalized On-Resistance Vs.Temperature
Fig. 5 -- Typical Capacitance Vs. Drain-to-Source
Voltage
Fig. 6 -- Typical Gate Charge Vs. Gate-to-Source
Voltage
ID = 18A
ID = 18A
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IRFN240 Device
Fig. 10b -- Switching Time Waveforms
Fig. 10a -- Switching Time Test Circuit
Fig. 9 -- Maximum Drain Current Vs. Case Temperature
Fig. 7 -- Typical Source-to-Drain Diode Forward
Voltage
1
10
100
1000
1
10
100
1000
OPERATION IN THIS AREA LIMITED
BY R
DS(on)
Single Pulse
T
T
= 150 C
= 25 C
°
°
J
C
V , Drain-to-Source Voltage (V)
I , Drain Current (A)
I , Drain Current (A)
DS
D
10us
100us
1ms
10ms
Fig. 8 -- Maximum Safe Operating Area
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IRFN240 Device
Fig. 12c -- Max. Avalanche Energy vs. Current
Fig. 13a -- Gate Charge Test Circuit
Fig. 12a -- Unclamped Inductive Test Circuit
Fig. 12b -- Unclamped Inductive Waveforms
0.01
0.1
1
10
0.00001
0.0001
0.001
0.01
0.1
1
Notes:
1. Duty factor D = t / t
2. Peak T = P
x Z
+ T
1
2
J
DM
thJC
C
P
t
t
DM
1
2
t , Rectangular Pulse Duration (sec)
Thermal Response
(Z )
1
thJC
0.01
0.02
0.05
0.10
0.20
0.50
SINGLE PULSE
(THERMAL RESPONSE)
Fig. 11 -- Maximum Effective Transient Thermal Impedance, Junction-to-Case Vs. Pulse Duration
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