ChipFind - Datasheet

Part Number HAF2015RJ

Download:  PDF   ZIP
HAF2015RJ
Silicon N Channel MOS FET Series
Power Switching
ADE-208-933 (Z)
1st. Edition
Dec. 2000
This FET has the over temperature shut­down capability sensing to the junction temperature. This FET has the
built­in over temperature shut­down circuit in the gate area. And this circuit operation to shut­down the gate
voltage in case of high junction temperature like applying over power consumption, over current etc.
Features
·
Logic level operation (5 to 6 V Gate drive)
·
High endurance capability against to the short circuit
·
Built­in the over temperature shut­down circuit
·
Temperature hysteresis type.
·
High density mounting.
Outline
1 2
3
4
5
6
7
8
1, 3 Source
2, 4 Gate
5, 6, 7, 8 Drain
SOP-8
MOS1
D
S
G
2
1
7
8
D
MOS2
D
S
G
4
3
5
6
D
Gate resistor
Tmperature
sencing
circuit
self
return
circuit
Gate
shutdown
circuit
Tmperature
sencing
circuit
Gate
shutdown
circuit
Gate resistor
self
return
circuit
HAF2015RJ
2
Absolute Maximum Ratings (Ta = 25°C)
Item
Symbol
Ratings
Unit
Drain to source voltage
V
DSS
60
V
Gate to source voltage
V
GSS
16
V
Gate to source voltage
V
GSS
­2.5
V
Drain current
I
D
2
A
Drain peak current
I
D(pulse)
Note1
4
A
Body-drain diode reverse drain current
I
DR
2
A
Avalanche current
I
AP
Note4
0.54
A
Avalanche energy
E
AR
Note4
25
mJ
Channel dissipation
Pch
Note2
2
W
Channel dissipation
Pch
Note3
1.5
W
Channel temperature
Tch
150
°
C
Storage temperature
Tstg
­55 to +150
°
C
Note:
1. PW
10
µ
s, duty cycle
1 %
2. 1 Drive operation : When using the glass epoxy board (FR4 40
×
40
×
1.6mm), PW
10s
3. 2 Drive operation : When using the glass epoxy board (FR4 40
×
40
×
1.6mm), PW
10s
4. Tch = 25
°
C , Rg > 50
Typical Operation Characteristics
Item
Symbol
Min
Typ
Max
Unit
Test Conditions
Input voltage
V
IH
3.5
--
--
V
V
IL
--
--
1.2
V
Input current
I
IH1
--
--
100
µA
Vi = 5V, V
DS
= 0
(Gate non shut down)
I
IH2
--
--
50
µA
Vi = 3.5V, V
DS
= 0
I
IL
--
--
1
µA
Vi = 1.2V, V
DS
= 0
Input current
I
IH(sd)1
--
0.53
--
mA
Vi = 8V, V
DS
= 0
(Gate shut down)
I
IH(sd)2
--
0.2
--
mA
Vi = 3.5V, V
DS
= 0
Shut down temperature
T
sd
--
175
--
°
C
Channel temperature
Hysteresis temperature
Thr
--
120
--
°
C
Channel temperature
Gate operation voltage
V
op
3.5
--
12
V
HAF2015RJ
3
Electrical Characteristics (Ta = 25°C)
Item
Symbol
Min
Typ
Max
Unit
Test Conditions
Drain current
I
D1
0.7
--
--
A
V
GS
= 3.5 V, V
DS
= 2 V
Drain current
I
D2
--
--
10
mA
V
GS
= 1.2 V, V
DS
= 2 V
Drain to source breakdown
voltage
V
(BR)DSS
60
--
--
V
I
D
= 10 mA, V
GS
= 0
Gate to source breakdown
voltage
V
(BR)GSS
16
--
--
V
I
G
= 300
µ
A, V
DS
= 0
Gate to source breakdown
voltage
V
(BR)GSS
­2.5
--
--
V
I
G
= ­100
µ
A, V
DS
= 0
Gate to source leak current
I
GSS1
--
--
100
µ
A
V
GS
= 5 V, V
DS
= 0
I
GSS2
--
--
50
µ
A
V
GS
= 3.5 V, V
DS
= 0
I
GSS3
--
--
1
µ
A
V
GS
= 1.2 V, V
DS
= 0
I
GSS4
--
--
­100
µ
A
V
GS
= ­2.4 V, V
DS
= 0
Input current (shut down)
I
GS(op)1
--
0.53
--
mA
V
GS
= 8 V, V
DS
= 0
I
GS(op)2
--
0.2
--
mA
V
GS
= 3.5 V, V
DS
= 0
Zero gate voltege drain current
I
DSS1
--
--
10
µ
A
V
DS
= 60 V, V
GS
= 0
Zero gate voltege drain current
I
DSS2
--
--
10
mA
V
DS
= 48 V, V
GS
= 0
Ta = 125°C
Gate to source cutoff voltage
V
GS(off)
1.4
--
2. 5
V
I
D
= 1 mA, V
DS
= 10V
Static drain to source on state
resistance
R
DS(on)
--
130
200
m
I
D
= 1 A, V
GS
= 5 V
Note5
Static drain to source on state
resistance
R
DS(on)
--
110
160
m
I
D
= 1 A, V
GS
= 10 V
Note5
Forward transfer admittance
|y
fs
|
0.5
2.5
--
S
I
D
= 1 A, V
DS
= 10 V
Note5
Output capacitance
Coss
--
139
--
pF
V
DS
= 10V , V
GS
= 0
f = 1 MHz
Turn-on delay time
t
d(on)
--
4.2
--
µs
I
D
= 1 A, V
GS
= 5 V
Rise time
t
r
--
20
--
µs
R
L
= 30
Turn-off delay time
t
d(off)
--
1
--
µs
Fall time
t
f
--
1
--
µs
Body­drain diode forward
voltage
V
DF
--
0.82
--
V
I
F
= 2A, V
GS
= 0
Body­drain diode reverse
recovery time
t
rr
--
55
--
ns
I
F
= 2A, V
GS
= 0
diF/ dt = 50 A/µs
Over load shut down
operation time
Note6
t
os1
--
15
--
ms
V
GS
= 5 V, V
DD
= 16 V
Note:
5. Pulse test
6. Including the junction temperature rise of the over loaded condition
HAF2015RJ
4
Main Characteristics
4.0
3.0
2.0
1.0
0
50
100
150
200
Channel Dissipation Pch (W)
Case Temperature Tc (
°
C)
Power vs. Temperature Derating
50
10
20
2
5
1
0.2
0.5
0.1
0.05
0.03
0.5
1
2
5
10
20
50 100
100
µ
s
1 ms
PW = 10 ms
Operation in this area
is limited by R
DS(on)
Thermal shut down
Operation area
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Maximum Safe Operation Area
5
4
3
2
1
0
2
4
6
8
10
10 V
8 V
V = 3.5 V
GS
6 V
5 V
4 V
Drain Current I (A)
D
Typical Output Characteristics
Pulse Test
2.5
2
1.5
1
0.5
0
1
2
3
4
5
Tc = -25
°
C
75
°
C
Gate to Source Voltage V (V)
GS
Typical Transfer Characteristics
V = 10 V
DS
Pulse Test
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Test Congition:
When using the glass epoxy board
(FR4 40
×
40
×
1.6mm), PW < 10 s
Note7
Note7:
When using the glass epoxy board
(FR4 40
×
40
×
1.6 mm)
1 Dr
ive Oper
ation
2 Dr
ive Oper
ation
Ta = 25
°
C
1 shot Pulse
1 Drive Operation
DC Operation
PW
<
10s
25
°
C
HAF2015RJ
5
0.25
0.2
0.15
0.1
0.05
0
2
4
6
8
10
0.5 A
0.2 A
I = 1 A
D
Pulse Test
Gate to Source Voltage V (V)
GS
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
V (V)
DS(on)
Drain to Source Saturation Voltage
500
0.1 0.2
0.5
1
2
5
10
20
200
100
20
50
10
V = 5 V
GS
Pulse Test
Drain Current (A)
D
Drain to Source On State Resistance
(m
)
DS(on)
Static Drain to Source Sate Resistance
vs. Drain Current
V = 10 V
GS
0.25
0.2
0.15
0.1
0.05
-40
0
40
80
120
160
0
V = 5 V
GS
I = 1 A
D
Pulse Test
Case Temperature Tc (
°
C)
Static Drain to Source on State Resistance
vs. Temperature
I = 1 A
D
V = 10 V
GS
10
2
5
1
0.2
0.1
0.5
0.05
0.1
0.2
0.5
1
2
5
Tc = -25
°
C
25
°
C
75
°
C
|yfs| (S)
Forward Transfer Admittance vs.
Drain Current
Forward Transfer Admittance
DS
V = 10 V
Pulse Test
I
R
Drain to Source On State Resistance
(m
)
DS(on)
R
Drain Current (A)
D
I
0.5 A, 0.2 A
0.5 A, 0.2 A
HAF2015RJ
6
Reverse Drain Current I (A)
DR
Reverse Recovery Time trr (ns)
Body to Drain Diode Reverse
Recovery Time
Drain Current I (A)
D
Switching Time t (
µ
s)
Switching Characteristics
5
4
3
2
1
0
0.4
0.8
1.2
1.6
2.0
GS
V = 5 V
0 V
Source to Drain Voltage V (V)
SD
Reverse Drain Current I (A)
DR
Reverse Drain Current vs.
Souece to Drain Voltage
1000
100
10
0
10
20
30
40
50
Capacitance Coss (pF)
Drain to Source Voltage V (V)
DS
Typical Capacitance vs.
Drain to Source Voltage
500
0.01 0.02
0.05 0.1 0.2
0.5
1
2
200
100
20
50
10
5
di / dt = 50 A /
µ
s
V = 0, Ta = 25
°
C
GS
5
0.01 0.02
0.05 0.1 0.2
0.5
1
2
2
1
0.5
5
50
20
10
100
r
t
V = 5 V, V = 30 V
PW = 300
µ
s, duty
1 %
GS
DD
t f
d (on)
t
d (off)
t
V = 0
f = 1 MHz
GS
Pulse Test
·
·
HAF2015RJ
7
12
10
8
6
4
2
0
Gate to Source Voltage V (V)
GS
Gate to Source Voltage vs.
Shutdown Time of Load-Short Test
0.0001
1
Shutdown Time of Load-Short Test
Pw (S)
200
180
160
140
120
0
Gate to Source Voltage V (V)
GS
Shutdown Case Temperature Tc (
°
C)
100
2
4
6
8
10
I = 0.2 A
D
Shutdown Case Temperature vs.
Gate to Source Voltage
0.001
0.01
0.1
V = 16 V
DD
Vin Monitor
D.U.T.
Vin
5V
R
L
V
= 30 V
DD
tr
td(on)
Vin
90%
90%
10%
10%
Vout
td(off)
Vout
Monitor
50W
90%
10%
t
f
Switching Time Test Circuit
Waveform
HAF2015RJ
8
10
µ
100
µ
1 m
10 m
100 m
1
10
Pulse Width PW (S)
Normalized Transient Thermal Impedance
s (t)
Normalized Transient Thermal Impedance vs. Pulse Width (1 Drive Operation)
100
1000
10000
10
1
0.1
0.01
0.001
0.0001
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
DM
P
PW
T
D =
PW
T
ch-f(t) = s (t) ch - f
ch-f = 125
°
C/W, Ta = 25
°
C
·
When using the glass epoxy board
(FR4 40
×
40
×
1.6mm)
10
µ
100
µ
1 m
10 m
100 m
1
10
Pulse Width PW (S)
Normalized Transient Thermal Impedance
s (t)
Normalized Transient Thermal Impedance vs. Pulse Width (2 Drive Operation)
100
1000
10000
10
1
0.1
0.01
0.001
0.0001
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
DM
P
PW
T
D =
PW
T
ch-f(t) = s (t) ch - f
ch-f = 166
°
C/W, Ta = 25
°
C
·
When using the glass epoxy board
(FR4 40
×
40
×
1.6mm)
HAF2015RJ
9
Package Dimensions
Hitachi Code
JEDEC
EIAJ
Mass (reference value)
FP-8DA
Conforms
--
0.085 g
*Dimension including the plating thickness
Base material dimension
1.75 Max
4.90
0.25
0.15
0
°
­ 8
°
M
8
5
1
4
1.27
3.95
0.40
±
0.06
*0.42
±
0.08
5.3 Max
0.75 Max
0.14
+ 0.11 ­ 0.04
0.20
±
0.03
*0.22
±
0.03
0.60
+ 0.67
­ 0.20
6.10
+ 0.10
­ 0.30
1.08
As of January, 2001
Unit: mm
HAF2015RJ
10
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi's or any third party's patent, copyright,
trademark, or other intellectual property rights for information contained in this document. Hitachi bears no
responsibility for problems that may arise with third party's rights, including intellectual property rights, in
connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact
Hitachi's sales office before using the product in an application that demands especially high quality and
reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury,
such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment
or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for
maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and
other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed
ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in
semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating
Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the
Hitachi product.
5. This product is not designed to be radiation resistant.
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without
written approval from Hitachi.
7. Contact Hitachi's sales office for any questions regarding this document or Hitachi semiconductor products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits.
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
Copyright
©
Hitachi, Ltd., 2000. All rights reserved. Printed in Japan.
Hitachi Asia Ltd.
Hitachi Tower
16 Collyer Quay #20-00,
Singapore 049318
Tel : <65>-538-6533/538-8577
Fax : <65>-538-6933/538-3877
URL : http://www.hitachi.com.sg
URL
NorthAmerica
: http://semiconductor.hitachi.com/
Europe
: http://www.hitachi-eu.com/hel/ecg
Asia
: http://sicapac.hitachi-asia.com
Japan
: http://www.hitachi.co.jp/Sicd/indx.htm
Hitachi Asia Ltd.
(Taipei Branch Office)
4/F, No. 167, Tun Hwa North Road,
Hung-Kuo Building,
Taipei (105), Taiwan
Tel : <886>-(2)-2718-3666
Fax : <886>-(2)-2718-8180
Telex : 23222 HAS-TP
URL : http://www.hitachi.com.tw
Hitachi Asia (Hong Kong) Ltd.
Group III (Electronic Components)
7/F., North Tower,
World Finance Centre,
Harbour City, Canton Road
Tsim Sha Tsui, Kowloon,
Hong Kong
Tel : <852>-(2)-735-9218
Fax : <852>-(2)-730-0281
URL : http://www.hitachi.com.hk
Hitachi Europe Ltd.
Electronic Components Group.
Whitebrook Park
Lower Cookham Road
Maidenhead
Berkshire SL6 8YA, United Kingdom
Tel: <44> (1628) 585000
Fax: <44> (1628) 585160
Hitachi Europe GmbH
Electronic Components Group
Dornacher Stra
e 3
D-85622 Feldkirchen, Munich
Germany
Tel: <49> (89) 9 9180-0
Fax: <49> (89) 9 29 30 00
Hitachi Semiconductor
(America) Inc.
179 East Tasman Drive,
San Jose,CA 95134
Tel: <1> (408) 433-1990
Fax: <1>(408) 433-0223
For further information write to:
Colophon 2.0