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Part Number SGH10N120RUF

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©2002 Fairchild Semiconductor Corporation
SGH10N120RUF Rev. B2
IGBT
S
G
H10N120RUF
SGH10N120RUF
Short Circuit Rated IGBT
General Description
Fairchild's RUF series of Insulated Gate Bipolar Transistors
(IGBTs) provide low conduction and switching losses as
well as short circuit ruggedness. The RUF series is
designed for applications such as motor control,
uninterrupted power supplies (UPS) and general inverters
where short circuit ruggedness is a required feature.
Features
· Short circuit rated 10
µ
s @ T
C
= 100
°
C, V
GE
= 15V
· High speed switching
· Low saturation voltage : V
CE(sat)
= 2.3 V @ I
C
= 10A
· High input impedance
Absolute Maximum Ratings
T
C
= 25
°
C unless otherwise noted
Notes :
(1) Repetitive rating : Pulse width limited by max. junction temperature
Thermal Characteristics
Symbol
Description
SGH10N120RUF
Units
V
CES
Collector-Emitter Voltage
1200
V
V
GES
Gate-Emitter Voltage
±
25
V
I
C
Collector Current
@ T
C
= 25
°
C
16
A
Collector Current
@ T
C
= 100
°
C
10
A
I
CM (1)
Pulsed Collector Current
30
A
T
SC
Short Circuit Withstand Time
@ T
C
= 100
°
C
10
µ
s
P
D
Maximum Power Dissipation
@ T
C
= 25
°
C
125
W
Maximum Power Dissipation
@ T
C
= 100
°
C
50
W
T
J
Operating Junction Temperature
-55 to +150
°
C
T
stg
Storage Temperature Range
-55 to +150
°
C
T
L
Maximum Lead Temp. for soldering
Purposes, 1/8" from case for 5 seconds
300
°
C
Symbol
Parameter
Typ.
Max.
Units
R
JC
Thermal Resistance, Junction-to-Case
--
1.0
°
C
/
W
R
JA
Thermal Resistance, Junction-to-Ambient
--
40
°
C
/
W
Applications
AC & DC motor controls, general purpose inverters, robotics, and servo controls.
G
C
E
G
C
E
G C E
TO-3P
background image
SGH10N120RUF Rev. B2
S
G
H10N120RUF
©2002 Fairchild Semiconductor Corporation
Electrical Characteristics of the IGBT
T
C
= 25
°
C unless otherwise noted
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Units
Off Characteristics
BV
CES
Collector-Emitter Breakdown Voltage
V
GE
= 0V, I
C
= 1mA
1200
--
--
V
B
VCES
/
T
J
Temperature Coefficient of Breakdown
Voltage
V
GE
= 0V, I
C
= 1mA
--
0.6
--
V/
°
C
I
CES
Collector Cut-Off Current
V
CE
= V
CES
, V
GE
= 0V
--
--
1
mA
I
GES
G-E Leakage Current
V
GE
= V
GES
, V
CE
= 0V
--
--
± 100
nA
On Characteristics
V
GE(th)
G-E Threshold Voltage
I
C
= 10mA, V
CE
= V
GE
3.5
5.5
7.5
V
V
CE(sat)
Collector to Emitter
Saturation Voltage
I
C
= 10A
,
V
GE
= 15V
--
2.3
3.0
V
I
C
= 16A
,
V
GE
= 15V
--
2.8
--
V
Dynamic Characteristics
C
ies
Input Capacitance
V
CE
= 30V
,
V
GE
= 0V,
f = 1MHz
--
950
--
pF
C
oes
Output Capacitance
--
75
--
pF
C
res
Reverse Transfer Capacitance
--
30
--
pF
Switching Characteristics
t
d(on)
Turn-On Delay Time
V
CC
= 600 V, I
C
= 10A,
R
G
= 25
, V
GE
= 15V,
Inductive Load, T
C
= 25
°
C
--
20
--
ns
t
r
Rise Time
--
60
--
ns
t
d(off)
Turn-Off Delay Time
--
60
110
ns
t
f
Fall Time
--
150
300
ns
E
on
Turn-On Switching Loss
--
0.65
--
mJ
E
off
Turn-Off Switching Loss
--
0.65
--
mJ
E
ts
Total
Switching
Loss
--
1.3
1.85
mJ
t
d(on)
Turn-On Delay Time
V
CC
= 600 V, I
C
= 10A,
R
G
= 25
, V
GE
= 15V,
Inductive Load, T
C
= 125
°
C
--
20
--
ns
t
r
Rise Time
--
70
--
ns
t
d(off)
Turn-Off Delay Time
--
80
150
ns
t
f
Fall Time
--
200
400
ns
E
on
Turn-On Switching Loss
--
0.75
--
mJ
E
off
Turn-Off Switching Loss
--
1.00
--
mJ
E
ts
Total
Switching
Loss
--
1.75
2.54
mJ
T
sc
Short Circuit Withstand Time
V
CC
= 600 V, V
GE
= 15V
@
T
C
= 100
°
C
10
--
--
µ
s
Q
g
Total Gate Charge
V
CE
= 600 V, I
C
= 10A,
V
GE
= 15V
--
50
75
nC
Q
ge
Gate-Emitter Charge
--
6
9
nC
Q
gc
Gate-Collector Charge
--
25
40
nC
L
e
Internal Emitter Inductance
Measured 5mm from PKG
--
14
--
nH
background image
SGH10N120RUF Rev. B2
S
G
H10N120RUF
©2002 Fairchild Semiconductor Corporation
Fig 1. Typical Output Characteristics
Fig 2. Typical Saturation Voltage Characteristics
Fig 3. Saturation Voltage vs. Case
Temperature at Variant Current Level
Fig 4. Load Current vs. Frequency
Fig 5. Saturation Voltage vs. V
GE
Fig 6. Saturation Voltage vs. V
GE
25
50
75
100
125
150
1.8
2.0
2.2
2.4
2.6
2.8
3.0
3.2
3.4
Common Emitter
V
GE
= 15V
I
C
= 10A
16A
C
o
l
l
ec
t
o
r
- Em
i
t
t
e
r
Vol
t
age,
V
CE
[V
]
Case Temperature, T
C
[
]
0
2
4
6
8
10
0
10
20
30
40
50
Common Emitter
V
GE
= 15V
T
C
= 25
T
C
= 125
Collector Cu
rrent, I
C
[A]
Collector - Emitter Voltage, V
CE
[V]
0
2
4
6
8
10
0
10
20
30
40
50
60
70
Common Emitter
T
C
= 25
20V
17V
15V
12V
V
GE
= 10V
C
o
llecto
r Curre
nt, I
C
[A]
Collector - Emitter Voltage, V
CE
[V]
0
4
8
12
16
20
0
4
8
12
16
20
Common Emitter
T
C
= 25
20A
10A
I
C
= 5A
Col
l
e
ct
or - Em
i
t
ter

Vol
t
age, V
CE
[V
]
Gate - Emitter Voltage, V
GE
[V]
0
4
8
12
16
20
0
4
8
12
16
20
Common Emitter
T
C
= 125
20A
10A
I
C
= 5A
C
o
lle
c
t
o
r
-
E
m
itte
r V
o
lta
g
e
,

V
CE
[V
]
Gate - Emitter Voltage, V
GE
[V]
0.1
1
10
100
1000
0
10
20
Duty cycle : 50%
T
C
= 100
Power Dissipation = 25W
V
CC
= 600V
Load Current : peak of square wave
Load Current [A]
Frequency [KHz]
background image
SGH10N120RUF Rev. B2
S
G
H10N120RUF
©2002 Fairchild Semiconductor Corporation
Fig 7. Capacitance Characteristics
Fig 8. Turn-On Characteristics vs.
Gate Resistance
Fig 9. Turn-Off Characteristics vs.
Gate Resistance
Fig 10. Switching Loss vs. Gate Resistance
Fig 11. Turn-On Characteristics vs.
Collector Current
Fig 12. Turn-Off Characteristics vs.
Collector Current
1
10
0
300
600
900
1200
1500
Common Emitter
V
GE
= 0V, f = 1MHz
T
C
= 25
Cies
Coes
Cres
Cap
a
cita
nce [
p
F]
Collector - Emitter Voltage, V
CE
[V]
10
100
10
100
Common Emitter
V
CC
= 600V, V
GE
=
±
15V
I
C
= 10A
T
C
= 25
T
C
= 125
tr
td(on)
Switching T
i
me [ns]
Gate Resistance, R
G
[
]
10
100
100
1000
Common Emitter
V
CC
= 600V, V
GE
=
±
15V
I
C
= 10A
T
C
= 25
T
C
= 125
tf
td(off)
Switch
ing Time
[ns]
Gate Resistance, R
G
[
]
5
10
15
20
10
100
Common Emitter
V
GE
=
±
15V, R
G
= 25
T
C
= 25
T
C
= 125
tr
td(on)
Switchin
g Time
[ns]
Collector Current, I
C
[A]
5
10
15
20
100
Common Emitter
V
GE
=
±
15V, R
G
= 25
T
C
= 25
T
C
= 125
tf
td(off)
Sw
itching Tim
e
[ns]
Collector Current, I
C
[A]
10
100
1000
Common Emitter
V
CC
= 600V, V
GE
=
±
15V
I
C
= 10A
T
C
= 25
T
C
= 125
Eoff
Eon
Eoff
S
witching L
o
ss [
µ
J]
Gate Resistance, R
G
[
]
background image
SGH10N120RUF Rev. B2
S
G
H10N120RUF
©2002 Fairchild Semiconductor Corporation
Fig 14. Gate Charge Characteristics
Fig 15. SOA Characteristics
Fig 16. Turn-Off SOA
Fig 17. Transient Thermal Impedance of IGBT
Fig 13. Switching Loss vs. Collector Current
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
10
1
1E-3
0.01
0.1
1
10
0.1
0.5
0.2
0.05
0.02
0.01
single pulse
T
h
e
r
m
a
l R
e
spo
n
se [Z
thjc]
Rectangular Pulse Duration [sec]
1
10
100
1000
1
10
Safe Operating Area
V
GE
= 20V, T
C
= 100
C
o
llector Current, I
C
[A
]
Collector - Emitter Current, V
CE
[V]
5
10
15
20
100
1000
Common Emitter
V
GE
=
±
15V, R
G
= 25
T
C
= 25
T
C
= 125
Eon
Eoff
Eon
Eoff
Switchi
ng Lo
ss [
µ
J]
Collector Current, I
C
[A]
0
10
20
30
40
50
60
0
2
4
6
8
10
12
14
16
Common Emitter
R
L
= 60
T
C
= 25
600V
400V
Vcc=200V
G
a
te
-
E
m
itte
r V
o
l
t
a
g
e
,
V
GE
[V
]
Gate Charge, Q
g
[nC]
0.1
1
10
100
1000
0.01
0.1
1
10
100
Single Nonrepetitive
Pulse T
C
= 25
Curves must be derated
linearly with increase
in temperature
50
µ
s
100
µ
s
1ms
DC Operation
I
C
MAX. (Pulsed)
I
C
MAX. (Continuous)
C
o
ll
ector
C
u
rre
nt, I
c
[A
]
Collector - Emitter Voltage, V
CE
[V]
Pdm
t1
t2
Duty factor D = t1 / t2
Peak Tj = Pdm
×
Zthjc + T
C